IEC EC 60749-44 Edition 1.0 2016-07 NTERNATIONAL STANDARD NORME INTERNATIONALE colour inside Semiconductor devices - Mechanical and climatic test methods Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductordevices Dispositifs a semiconducteurs - Methodes d'essais mécaniques et climatiques - Partie 44: Methode d'essai des effets d'un événement isole (SEE) irradie par un faisceau de neutrons pour des dispositifs a semiconducteurs IEC 60749-44:2016-07(en-fr) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright @ 2016 IEC, Geneva, Switzerland orby any means, electronic or mechanical, including photocopying and microfilm, withoutpermission in writing from copyright or have an enquiry about obtaining additional rights to this publication, piease contact the address below or your local IEC member National Committee for further information. Droits de reproduction reservés. Sauf indication contraire, aucune partie de cette publication ne peut etre reproduite ni utilisee sous quelque forme que ce soit et par aucun procede, electronique ou mecanique, y compris la photocopie et les microfilms, sans I'accord écrit de I'lEC ou du Comite national de I'lEC du pays du demandeur. Si vous avez des questions sur le copyright de I'iEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnees ci-apres ou contactez le Comite national de I'lEC de votre pays de residence. IECCentralOffice Tel.: +4122 919 02 11 3,rue deVarembé Fax:+41229190300 CH-1211 Geneva 20
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